Journey to Data Quality - Paperback, by Lee Yang W.; Pipino Leo L.; Funk - Good

Description: Journey to Data Qualityby Lee, Yang W.; Pipino, Leo L.; Funk, James D.; Wang, Richard Y. Description: It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience.Product ID: 0262513358-11-1

Price: 10.94 USD

Location: Philadelphia, Pennsylvania

End Time: 2024-10-28T23:38:52.000Z

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Book Title: Journey to Data Quality

Number of Pages: 240 Pages

Language: English

Publication Name: Journey to Data Quality

Publisher: MIT Press

Publication Year: 2009

Subject: Data Modeling & Design, Industrial Management, Databases / General, Enterprise Applications / General, Information Technology

Item Height: 0.5 in

Type: Textbook

Item Weight: 11 Oz

Item Length: 8.9 in

Author: James D. Funk, Leo L. Pipino, Y. Lee, Yang W. Lee, Richard Y. Wang

Subject Area: Computers, Business & Economics

Item Width: 6.3 in

Format: Trade Paperback