MPI Corp. LEDA-8F 3G Plus-V 110 LED Prober Station

Description: MPI Corp. LEDA-8F 3G Plus-V 110 LED Prober Station Inventory No. 58957 3G Plus-V is a wafer prober for testing diced die on stretch frame (dies on blue tape mounted on a tape ring). Wafers cut, broken by scribing, laser etc. and then expanded on stretch frame. May be tested to determine if any secondary operations have damaged the product. The maximum test area for the system is 6 inches of active die area or smaller. Machine Features: 3G Plus-V provides the functions of die position information saving, auto-probing, testing etc. It contains these advantages: * Automatic diced wafer alignment. * Rapid pre-scan provides fast die position information speeding test and increasing throughput. Probe station for testing LED light emitting diodes. Compact rigid and reliable semiautomatic chip probing system. PC controller. 5 in. dia. vacuum chuck. Four precision probe manipulators. StereoZoom microscope. WEI Industries Co. Ltd model LED-632HC LED tester. 110V, 50/60 Hz. Please contact us for additional information on this system, including lead-time, or for any questions via eBay mail. BID SERVICE has been meeting the equipment needs of the Semiconductor and Scientific communities for the past 30 years. Our expert refurbishing services, demonstration capabilities, and broad selection of inventory add up to value for our customers. *****International Buyers - Please Note: Import duties, taxes, and charges are not included in the item price or shipping cost. These charges are the buyer's responsibility. Please check with your country's customs office to determine what these additional costs will be prior to bidding or buying. Contact a freight forwarder who can get you actual prices.*****

Price: 2500 USD

Location: Freehold, New Jersey

End Time: 2024-04-28T18:06:51.000Z

Shipping Cost: N/A USD