Description: This book is a valuable resource for anyone interested in the subject areas of technology and engineering, science, spectroscopy and spectrum analysis, electron microscopes and microscopy, chemistry, physical and theoretical, nanotechnology and mems, and microscopes and microscopy. It provides comprehensive information on applied scanning probe methods, including techniques such as scanning probe microscopy, and covers a wide range of topics related to nanotechnology. The book is authored by H. Fuchs and Bharat Bhushan, and has a total of Lix, 465 pages. The book is published by Springer Berlin / Heidelberg and has a hardcover format with dimensions of 9.3 in x 6.1 in x 0.4 in and a weight of 33.5 Oz. It was published in 2008 and is part of the Nanoscience and Technology Ser. series. The book is written in English and is an excellent resource for anyone interested in the subject of nanotechnology.
Price: 125 USD
Location: Ocoee, Florida
End Time: 2024-12-03T16:11:16.000Z
Shipping Cost: 7.75 USD
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Item Specifics
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 14 Days
Refund will be given as: Money back or replacement (buyer's choice)
Number of Pages: Lix, 465 Pages
Publication Name: Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
Language: English
Publisher: Springer Berlin / Heidelberg
Publication Year: 2008
Subject: Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Nanotechnology & Mems, Microscopes & Microscopy
Item Height: 0.4 in
Type: Textbook
Item Weight: 33.5 Oz
Author: H. Fuchs, Bharat Bhushan
Item Length: 9.3 in
Subject Area: Technology & Engineering, Science
Series: Nanoscience and Technology Ser.
Item Width: 6.1 in
Format: Hardcover
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