Description: presents ... Reliability Wearout Mechanisms in Advanced CMOS Technologies ISBN:0471731722 Author:Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Sune, Jordi; La Rosa, Giuseppe; Sullivan, Timothy D.; Rauch III, Stewart E. Publisher:Wiley-IEEE Press Release Date:2009-08-24 Seller Category:-- Qty Available:1 Condition:Used: Very Good Sku: 2208140013 Notes: Minor read/shelf wear. Ships Daily! Don't forget to check out other great deals in our eBay Store!!
Price: 112.99 USD
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Number of Pages: 640 Pages
Language: English
Publication Name: Reliability Wearout Mechanisms in Advanced Cmos Technologies
Publisher: Wiley & Sons, Incorporated, John
Item Height: 1.4 in
Publication Year: 2009
Subject: Electronics / Semiconductors, Electrical
Type: Textbook
Item Weight: 35.1 Oz
Subject Area: Technology & Engineering
Item Length: 9.6 in
Author: Jordi Sune, Alvin W. Strong, Ernest Y. Wu, Giuseppe La Rosa, Rolf-Peter Vollertsen
Series: IEEE Press Series on Microelectronic Systems Ser.
Item Width: 6.4 in
Format: Hardcover
